Capacitor de Chip Cerâmico Multicamada (Série MC MC12JTB501682)

Capacitor de Chip Cerâmico Multicamada (Série MC MC12JTB501682) / Viking Tech tem experiência no design de componentes inovadores, oferecendo suporte e serviço a clientes globais que exigem um parceiro de fabricação genuíno. Nosso objetivo é ser líder no design, fabricação e marketing de componentes passivos em miniatura e de precisão usados em aplicações automotivas, industriais e eletrônicas 3C.

Capacitor de Chip Cerâmico Multicamada (Série MC MC12JTB501682)

Enviar consulta Adicionado a lista

MC12JTB501682

Capacitor de Chip Cerâmico Multicamada (Série MC MC12JTB501682)
Capacitor de Chip Cerâmico Multicamada (Série MC MC12JTB501682) Files Download

Capacitor cerâmico multicamadas, MLCC, capacitor de chip para múltiplos tamanhos e materiais para suportar uma ampla faixa de capacitância, tamanho extremamente compacto, baixa indutância e alta frequência, excelente soldabilidade e resistência à soldagem, baixa ESR, adaptável a todos os tipos de aplicações. Conforme EIAJ-RC3402 e também compatível com EIA-RS198 e IEC PUB. 384-10.
MC Series1812 ±5% 1K/Reel X7R 6800pF 500V

TamanhoTolerânciaPacoteDieletricoCapacitância (pF)Tensão (V)
1812±5%1K/ReelX7R6800500

Capacitores de Ultra Alta Q e Baixo ESR para a Série MCRF

Capacitance & Voltage

DielectricNPO
EIASize0201040206030805
CodeVDCW6.3V10V25V50V25V50V100V200V50V100V250V50V100V250V500V
0R10.1pFLLLLNNNN       
0R20.2LLLLNNNN       
0R30.3LLLLNNNNSSSTTTT
0R40.4LLLLNNNNSSSTTTT
0R50.5LLLLNNNNSSSTTTT
0R60.6LLLLNNNNSSSTTTT
0R70.7LLLLNNNNSSSTTTT
0R80.8LLLLNNNNSSSTTTT
0R90.9LLLLNNNNSSSTTTT
1R01.0LLLLNNNNSSSTTTT
1R21.2LLLLNNNNSSSTTTT
1R51.5LLLLNNNNSSSTTTT
1R81.8LLLLNNNNSSSTTTT
2R02.0LLLLNNNNSSSTTTT
2R22.2LLLLNNNNSSSTTTT
2R72.7LLLLNNNNSSSTTTT
3R03.0LLLLNNNNSSSTTTT
3R33.3LLLLNNNNSSSTTTT
3R93.9LLLLNNNNSSSTTTT
4R04.0LLLLNNNNSSSTTTT
4R74.7LLLLNNNNSSSTTTT
5R05.0LLLLNNNNSSSTTTT
5R65.6LLLLNNNNSSSTTTT
6R06.0LLLLNNNNSSSTTTT
6R86.8LLLLNNNNSSSTTTT
7R07.0LLLLNNNNSSSTTTT
8R28.2LLLLNNNNSSSTTTT
9R09.0LLLLNNNNSSSTTTT
10010LLLLNNNNSSSTTTT
11011LLLLNNNNSSSTTTT
12012LLLLNNNNSSSTTTT
13013LLLLNNNNSSSTTTT
15015LLLLNNNNSSSTTTT
16016LLLLNNNNSSSTTTT
18018LLLLNNNNSSSTTTT
20020LLLLNNNNSSSTTTT
22022LLL NNNNSSSTTTT
24024LLL NNNNSSSTTTT
27027LLL NNNNSSSTTTT
30030LLL NNNNSSSTTTT
33033LLL NNN SSSTTTT
36036    NNN SSSTTTT
39039    NNN SSSTTTT
43043    NNN SSSTTTT
47047    NNN SSSTTTT
56056    N   SSSTTTT
68068    N   SSSTTTT
82082    N   SSSTTT 
101100    N   SSSTTT 

    The letter in cell is expressed the symbol of product thickness.

Electrical Data

DielectricNPO
Size0201, 0402, 0603, 0805
Capacitance*0201: 0.1pF ~ 33pF , 0402: 0.1pF ~ 100pF
0603: 0.3pF ~ 100pF , 0805: 0.3pF ~ 100pF
Capacitance tolerance**Cap ≦ 5pF: A (± 0.05pF), B (± 0.1pF), C (± 0.25pF)
5pF<Cap<10pF: B (± 0.1pF), C (± 0.25pF) , D (± 0.5pF)
Cap ≧ 10pF: F (± 1%), G (± 2%), J (± 5%)
Rated voltage (VDCW)6.3V, 10V, 25V, 50V, 100V, 250V, 500V
Q *Cap ≧ 30pF: Q ≧ 1000, Cap<30pF: Q ≧ 400+20C;
Insulation resistance at Ur≧ 10GΩ
Operating temperature-55 to +125°C
Capacitance± 30 ppm; 0201 Cap ≧ 22pF, ± 60 ppm
TerminationNi / Sn (lead-free termination)

☑ '*' Measured at the conditions of 25°C ambient temperature and 30 ~ 70% related humidity.
☑ Apply 1.0 ± 0.2Vrms, 1.0MHz ± 10% for Cap ≦ 1000pF; 1.0KHz ± 10% for Cap>1000pF.

Electrical Characteristics

Ultra High Q & Low ESR Capacitors for MCRF Series - Electrical Characteristics

Características Ambientais

ItemRequirementTest Method
External AppearanceNo defects which may affect performanceVisual inspection & Dimension measurement
Capacitance(Cap.)Within the specified tolerance that refers on page2NPO: (Class I)
Cap ≤ 1000pF 1.0 ± 0.2Vrms, 1MHz ± 10%
Cap>1000pF 1.0 ± 0.2Vrms, 1KHz ± 10%
X7R, X5R, Y5V: (Class II)
Cap ≤ 10uF 1.0 ± 0.2Vrms, 1KHz ± 10%**
Cap>10uF 0.5 ± 0.2Vrms, 120Hz ± 10%
** Test condition: 0.5 ± 0.2Vrms，1KHz ± 10%
X7R:
0805=106(6.3V, 10V), 0603/475 (6.3V)
X5R:
0201 ≧ 224 (6.3V, 10V, 16V)#1
0402 ≧ 475 (6.3V, 16V), 0402 ≧ 225 (10V)
0603=106 (6.3V, 10V),
#1 Excluding
X5R / 0201 / 105 (6.3V); 225 (10V),
(1.0 ± 0.2Vrms, 1KHz ± 10%)
*Before initial measurement (Class II only):
To apply de-aging at 150°C for 1hr then set
for 24 ± 2 hrs at room temp.

Dissipation Factor
(D.F.) or Quality factor
(Q=1/D.F.)		NPO: Cap ≥ 30pF, Q ≥ 1000; Cap<30pF, Q ≥ 400+20C
X7R, X5R:
Rated vol.D.F. ≦Exception of D.F. ≦
≧ 100V2.5%3%1206 ≧ 0.047μF
5%0603 ≧ 0.068μF; 0805 ≧ 0.1μF
1206>1μF; 1210 ≧ 2.2μF
10%0805 > 0.22μF;1210 ≧ 3.3μF
50V2.5%3%0201(50V); 0603 ≧ 0.047μF
0805 ≧ 0.18μF; 1206 ≧ 0.47μF
5%0201 ≧ 0.01uF; 1210 ≧ 4.7μF
10%0402 ≧ 0.1μF;0603>0.1μF; 0805 ≧ 1μF;1206 ≧ 2.2μF; 1210 ≧ 10μF
35V3.5%10%0603 ≧ 1μF;0805 ≥ 2.2μF;1206 ≧ 2.2μF;1210 ≧ 10μF
25V3.5%5%0201 ≧ 0.01μF; 0805 ≧ 1μF;1210 ≧ 10μF
7%0603 ≧ 0.33μF; 1206 ≧ 4.7μF
10%0201 ≧ 0.1μF;0402 ≧ 0.10μF; 0603 ≧ 0.47μF
0805 ≧ 2.2μF; 1206 ≧ 6.8μF;1210 ≧ 22μF
12.5%0402 ≥ 0.47μF
16V3.5%5%0201 ≧ 0.01μF; 0402 ≧ 0.033μF;0603 ≧ 0.15μF; 0805 ≧ 0.68μF;1206 ≧ 2.2μF; 1210 ≧ 4.7μF
10%0201 ≧ 0.1μF(0201 / X7R ≧ 0.022μF);
0402 ≧ 0.22μF; 0603 ≧ 0.68μF;0805 ≧ 2.2μF; 1206 ≧ 4.7μF;1210 ≧ 22μF
10V5%10%0201 ≧ 0.012μF;0402 ≧ 0.33μF(0402 / X7R ≧ 0.22μF)
0603 ≧ 0.33μF; 0805 ≧ 2.2μF
1206 ≧ 2.2μF;1210 ≧ 22μF
15%0201 ≧ 0.1μF; 0402 ≧ 1μF
6.3V10%15%0201 ≧ 0.1μF; 0402 ≧ 1μF
0603 ≧ 10μF; 0805 ≧ 4.7μF
1206 ≧ 47μF;1210 ≧ 100μF
20%0402 ≧ 2.2μF

Y5V:

Rated vol.D.F. ≦Exception of D.F. ≦
≧ 50V5%7%0603 ≧ 0.1μF; 0805 ≧ 0.47μF;1206 ≧ 4.7uF
12.5%1210 ≧ 6.8μF
35V7%——
25V5%7%0402 ≧ 0.047μF; 0603 ≧ 0.1μF
0805 ≧ 0.33μF; 1206 ≧ 1μF
1210 ≧ 4.7μF
9%0402 ≧ 0.068μF; 0603 ≧ 0.47μF
1206 ≧ 4.7μF; 1210 ≧ 22μF
16V
(C < 1.0μF)		7%9%0402 ≧ 0.068μF; 0603 ≧ 0.68μF
12.5%0402 ≧ 0.22μF
16V
(C ≧ 1.0μF)		9%12.5%0603 ≧ 2.2μF; 0805 ≧ 3.3μF
1206 ≧ 10μF; 1210 ≧ 22μF
1812 ≧ 47μF
10V12.5%20%0402 ≧ 0.47μF
6.3V20%--
Dielectric StrengthNo evidence of damage or flash over during testTo apply voltage (≤ 100V) 250%
Duration: 1 to 5sec
Charge and discharge current less than 50mA
To apply voltage:
200V ~ 300V ≧ 2 time VDC
500V ~ 999V ≧ 1.5 time VDC
1000V ~ 3000V ≧ 1.2 time VDC
Cut-off, set at 10mA
TEST=15 sec. RAMP=0
ItemRequirementTest Method
Insulation Resistance10GΩ or R x C ≧ 500Ω-F Whichever is smaller X7R, X5R, Y5V:
Rated VoltageInsulation Resistance
100V: X7R10G Ω or R x C ≧ 100Ω-F Whichever is smaller
50V: 0402>0.01μF;0603 ≧ 1μF;0805 ≧ 1μF;
1206 ≧ 4.7μF;1210 ≧ 4.7μF
35V: 0805 ≧ 2.2μF;1206 ≧ 2.2μF;1210 ≧ 10μF
25V: 0402 ≧ 1uF;0603 ≧ 2.2uF;0805 ≧ 2.2uF
1206 ≧ 10uF;1210 ≧ 10uF
16V: 0201 ≧ 0.1μF,0402 ≧ 0.22μF;0603 ≧ 1μF;
0805 ≧ 2.2μF;1206 ≧ 10μF;1210 ≧ 47μF
10V: 0201 ≧ 47nF;0402 ≧ 0.47uF;0603 ≧ 0.47uF
0805 ≧ 2.2uF;1206 ≧ 4.7uF;1210 ≧ 47uF
6.3V
To apply rated voltage for max. 120sec
*Before initial measurement (Class II only):
To apply de-aging at 150°C for 1hr then set for 24 ± 2 hrs at room temp.
≧ 10GΩ or 100Ω-F whichever is smaller
Rated voltage: 200V ~ 630V		To apply rated voltage (500V max.) for 60sec.
≧ 10GΩ
Rated voltage: >630V		To apply 500V for 60sec.
Temperature Characteristic of Capacitance
T.C.Capacitance Change
NPO± 30 (ppm/°C)
X7R± 15%
X5R± 15%
Y5V+30% ~ -80%
With no electrical load.
T.C.Operating Temp
NPO-55 ~ 125°C at 25°C
X7R-55 ~ 125°C at 25°C
X5R-55 ~ 85°C at 25°C
Y5V-25 ~ 85°C at 20°C

*Before initial measurement (Class II only):
To apply de-aging at 150°C for 1hr then set for 24 ± 2 hrs at room temp.
* Measurement voltage for Class II:

02010402
Cap<0.1μF:1VCap<1μF: 1V
0.1μF ≤ Cap<1μF: 0.2VCap=1μF: 0.5V
Cap ≧ 1μF: 0.1V1μF<Cap<10μF: 0.2V
 Cap ≧ 10μF: 0.1V
06030805
Cap ≤ 1μF: 1VCap<10μF: 1V
1μF<Cap ≤ 4.7μF: 0.5VCap=10μF: 0.5V
Cap>4.7μF: 0.2VCap>10μF: 0.2V
12061210
Cap ≤ 10μF: 1VCap ≤ 10μF: 1V
10μF<Cap ≤ 100μF: 0.5V10μF<Cap ≤ 100μF: 0.5V
Cap>100μF: 0.2VCap>100μF: 0.2V
Adhesive Strength of TerminationNo remarkable damage or removal of the terminationsPressurizing force:
0201: 2N
0402 & 0603: 5N > 0603: 10N
Test time: 10 ± 1 sec
Vibration ResistanceNo remarkable damage Cap change and Q/D.F.: To meet initial specVibration frequency: 10 ~ 55Hz/min
Total amplitude: 1.5mm
Test time: 6hrs. (two hrs each in three mutually
Perpendicular directions.)
*Before initial measurement (Class II only):
To apply de-aging at 150°C for 1hr then set for 24 ± 2 hrs at room temp.
*Cap./DF(Q) Measurement to be made after de-aging at 150°C for 1hr then set for 24 ± 2 hrs at room temp.
Solderability95% min. coverage of all metalized area.Solder temperature: 235 ± 5°C
Dipping time: 2 ± 0.5 sec.
ItemRequirementTest Method
Bending TestNo remarkable damage.
Cap change:
NP0: within ± 5% or 0.5pF whichever is larger
X7R, X5R, X6S, X7S: within ± 12.5%
Y5V: within ± 30%
(This capacitance change means the change of capacitance under specified flexure of substrate from the capacitance measured before the test.)		The middle part of substrate shall be pressurized by means of the pressurizing rod at a rate of about 1 mm per second until the deflection becomes 1 mm and then the pressure shall be maintained for 5 ± 1 sec.
* Before initial measurement (Class II only):
To apply de-aging at 150°C for 1hr then set for 24 ± 2 hrs at room temp.
Measurement to be made after keeping at room temp. for 24 ± 2 hrs.
Resistance to Soldering HeatNo remarkable damage.
Cap change:
NP0: within ± 2.5% or 0.25pF whichever is larger X7R, X5R, X6S, X7S: within ± 7.5%
Y5V: within ± 20%
Q/D.F., I.R. and dielectric strength: To meet initial requirements.
25% max. leaching on each edge		Solder temperature: 260 ± 5°C
Dipping time: 10 ± 1 sec
Preheating: 120 to 150°C for 1 minute before immerse the capacitor in a eutectic solder.
* Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24 ± 2 hrs at room temp.
Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150°C for 1hr then set for 24 ± 2 hrs at room temp
Temperature Cycle

No remarkable damage.
* Cap change:
NP0: within ± 2.5% or 0.25pF whichever is larger X7R, X5R, X6S, X7S: within ± 7.5%
Y5V: within ± 20%
* Q/D.F., I.R. and dielectric strength: To meet initial requirements

Conduct the five cycles according to the temperature and time.

StepTemp. (°C)Time (min)
1Min. operating temp. +0 / -330 ± 3
2Room temp2-3
3Max. operating temp. +3 / -030 ± 3
4Room temp.2-3

Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24 ± 2 hrs at room temp.
Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150°C for 1hr then set for 24 ± 2 hrs at room temp.

ItemRequirementTest Method
Humidity (steady state)No remarkable damage.
Cap change:
NP0: within ± 5% or 0.5pF whichever is larger
X7R, X5R: ≥ 10V**,within ± 12.5%; ≦ 6.3V within ± 25%;C ≥ 1μF,within ± 25%
**10V: 0603 ≧ 4.7μF;0402 ≧ 1μF;0201 ≧ 0.1μF, within ± 25%;
Y5V: ≥ 10V, within ± 30%; ≦ 6.3V, within +30 / -40%
Q/D.F. value:
NP0: More than 30pF Q ≥ 350, 10pF ≦ C ≦ 30pF, Q ≥ 275 + 2.5C Less than 10pF Q ≥ 200+10C
X7R, X5R:

Rated vol.D.F. ≦Exception of D.F. ≦
≧ 100V3%6%1206 ≧ 0.47μF
7.5%0603 ≧ 0.068μF; 0805>0.1μF;1206>1μF; 1210 ≧ 2.2μF
20%0805 > 0.22μF;1210 ≧ 3.3μF
≧ 50V3%6%0201(50V); 0603 ≧ 0.047μF;0805 ≧ 0.18μF; 1206 ≧ 0.47μF
10%0201 ≧ 0.01μF; 1210 ≧ 4.7μF
20%0402 ≧ 0.1μF;0603>0.1μF;0805 ≧ 1μF;1206 ≧ 2.2μF; 1210 ≧ 10μF
35V5%20%0603 ≧ 1μF;0805 ≥ 2.2μF;1206 ≧ 2.2μF;1210 ≧ 10μF
25V5%10%0201 ≧ 0.01μF; 0805 ≧ 1μF;1210 ≧ 10μF
14%0603 ≧ 0.33μF; 1206 ≧ 4.7μF
15%0201 ≧ 0.1μF;0402 ≧ 0.10μF; 0603 ≧ 0.47μF
0805 ≧ 2.2μF; 1206 ≧ 6.8μF;1210 ≧ 22μF
20%0402 ≥ 0.47μF
16V5%10%0603 ≧ 0.15μF; 0805 ≧ 0.68μF;1206 ≧ 2.2μF;1210 ≧ 4.7μF
15%0201 ≧ 0.01μF(0201/X7R ≧ 0.022μF);
0402 ≧ 0..33μF; 0603 ≧ 0.68μF;0805 ≧ 2.2μF;
1206 ≧ 4.7μF;1210 ≧ 22μF
10V7.5%15%0201 ≧ 0.012μF;0402 ≧ 0.33μF(0402/X7R ≧ 0.22μF)
0603 ≧ 0.33μF; 0805 ≧ 2.2μF;1206 ≧ 2.2μF;1210 ≧ 22μF
20%0201 ≧ 0.1μF; 0402 ≧ 1μF
6.3V15%30%0201 ≧ 0.1μF; 0402 ≧ 1μF;0603 ≧ 10μF; 0805 ≧ 4.7μF
1206 ≧ 47μF;1210 ≧ 100μF

Y5V:

Rated vol.D.F. ≦Exception of D.F. ≦
≧ 50V7.5%10%0603 ≧ 0.1μF; 0805 ≧ 0.47μF;1206 ≧ 4.7μF
20%1210 ≧ 6.8μF
35V10%——
25V7.5%10%0402 ≧ 0.047μF; 0603 ≧ 0.1μF;0805 ≧ 0.33μF;
1206 ≧ 1μF;1210 ≧ 4.7μF
15%0402 ≧ 0.068μF; 0603 ≧ 0.47μF;1206 ≧ 4.7μF;
1210 ≧ 22μF
16V
(C < 1.0μF)		10%12.5%0402 ≧ 0.068μF; 0603 ≧ 0.68μF
20%0402 ≧ 0.22μF
16V
(C ≧ 1.0μF)		12.5%20%0603 ≧ 2.2μF; 0805 ≧ 3.3μF;1206 ≧ 10μF;
1210 ≧ 22μF;1812 ≧ 47μF
10V20%30%0402 ≧ 0.47μF
6.3V30%--

I.R.: ≥ 10V, 1GΩ or 50 Ω-F whichever is smaller.
Class II (X7R, X5R, Y5V)

Rated VoltageInsulation Resistance
100V: X7R10GΩ or R x C ≧ 10Ω-F Whichever is smaller
50V: 0402>0.01μF;0603 ≥ 1μF;0805 ≥ 1μF;
1206 ≥ 4.7μF;1210 ≥ 4.7μF
35V: 0603 ≥ 1μF;0805 ≥ 2.2μF; 1206 ≧ 2.2μF;1210 ≧ 10μF
25V: 0201 ≧ 0.1μF; 0402 ≥ 0.22μF;
0603 ≥ 2.2μF;0805 ≥ 2.2μF;
1206 ≥ 10μF;1210 ≥ 10μF
16V: 0201 ≥ 0.1μF,0402 ≥ 0.22μF;0603 ≥ 1μF;
0805 ≥ 2.2μF;1206 ≥ 10μF;1210 ≥ 47μF
10V: 0201 ≥ 47nF;0402 ≥ 0.47μF;0603 ≥ 0.47μF
0805 ≥ 2.2μF;1206 ≥ 4.7μF;1210 ≥ 47μF
6.3V
Test temp.: 40 ± 2°C
Humidity: 90 ~ 95%RH
Test time: 500 + 24 / -0hrs.
Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24 ± 2 hrs at room temp.
Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150°C for 1hr then set for 24 ± 2 hrs at room temp.
ItemRequirementTest Method
Humidity loadNo remarkable damage.
Cap change:
NP0: ± 7.5% or 0.75pF whichever is larger.
X7R, X5R, X6S, X7S: ≥ 10V**,within ± 12.5%; ≦ 6.3V within ± 25%;
TT series & C ≥ 1uF,within ± 25%
**10V: 0603 4.7μF;0402 1μF;0201 ≧ ≧ ≧ 0.1μF, within ± 25%;
Y5V: ≥ 10V, within ± 30%; ≦ 6.3V, within +30 / -40%
Q/D.F. value:
NP0: C ≥ 30pF,Q ≥ 200;C<30pF, Q ≥ 100+10 / 3C
X7R, X5R:
Rated vol.D.F. ≦Exception of D.F. ≦
≧ 100V3%6%1206 ≧ 0.47μF
7.5%0603 ≧ 0.068μF; 0805>0.1μF;1206>1μF; 1210 ≧ 2.2μF
20%0805 > 0.22μF;1210 ≧ 3.3μF
≧ 50V3%6%0201(50V); 0603 ≧ 0.047μF;0805 ≧ 0.18μF; 1206 ≧ 0.47μF
10%0201 ≧ 0.01uF; 1210 ≧ 4.7μF
20%0402 ≧ 0.1μF;0603>0.1μF;0805 ≧ 1μF;1206 ≧ 2.2μF; 1210 ≧ 10μF
35V5%20%0603 ≧ 1μF;0805 ≥ 2.2μF;1206 ≧ 2.2μF;1210 ≧ 10μF
25V5%10%0201 ≧ 0.01μF; 0805 ≧ 1μF;1210 ≧ 10μF
14%0603 ≧ 0.33μF; 1206 ≧ 4.7μF
15%0201 ≧ 0.1μF;0402 ≧ 0.10μF; 0603 ≧ 0.47μF
0805 ≧ 2.2μF; 1206 ≧ 6.8μF;1210 ≧ 22μF
20%0402 ≥ 0.47μF
16V5%10%0603 ≧ 0.15μF; 0805 ≧ 0.68μF;1206 ≧ 2.2μF;1210 ≧ 4.7μF
15%0201 ≧ 0.01μF (0201 / X7R ≧ 0.022μF);
0402 ≧ 0..33μF; 0603 ≧ 0.68μF;0805 ≧ 2.2μF;
1206 ≧ 4.7μF;1210 ≧ 22μF
10V7.5%15%0201 ≧ 0.012μF;0402 ≧ 0.33μF(0402/X7R ≧ 0.22μF)
0603 ≧ 0.33μF; 0805 ≧ 2.2μF;1206 ≧ 2.2μF;1210 ≧ 22μF
20%0201 ≧ 0.1μF; 0402 ≧ 1μF
6.3V15%30%0201 ≧ 0.1μF; 0402 ≧ 1μF;0603 ≧ 10μF; 0805 ≧ 4.7μF
1206 ≧ 47μF;1210 ≧ 100μF

Y5V:

Rated vol.D.F. ≦Exception of D.F. ≦
≧ 50V7.5%10%0603 ≧ 0.1μF; 0805 ≧ 0.47μF;1206 ≧ 4.7uF
20%1210 ≧ 6.8μF
35V10%--
25V7.5%10%0402 ≧ 0.047μF; 0603 ≧ 0.1μF;0805 ≧ 0.33μF;
1206 ≧ 1μF;1210 ≧ 4.7μF
15%0402 ≧ 0.068μF; 0603 ≧ 0.47μF;1206 ≧ 4.7μF;
1210 ≧ 22μF
16V (C ＜ 1.0μF)10%12.5%0402 ≧ 0.068μF; 0603 ≧ 0.68μF
20%0402 ≧ 0.22μF
16V (C ≧ 1.0μF)12.5%20%0603 ≧ 2.2μF; 0805 ≧ 3.3μF;1206 ≧ 10μF;
1210 ≧ 22μF;1812 ≧ 47μF
10V20%30%0402 ≧ 0.47μF
6.3V30%--

I.R.: ≥ 10V, 500MΩ or 25 Ω-F whichever is smaller.
Class II (X7R, X5R, Y5V)

Rated VoltageInsulation Resistance
100V: X7R500MΩ or R x C ≧ 5Ω-F Whichever is smaller
50V: 0402>0.01μF;0603 ≥ 1μF;0805 ≥ 1μF;
1206 ≥ 4.7μF;1210 ≥ 4.7μF
35V: 0603 ≥ 1μF;0805 ≥ 2.2μF; 1206 ≧ 2.2μF;1210 ≧ 10μF
25V: 0201 ≧ 0.1uF; 0402 ≥ 0.22μF; 0603 ≥ 2.2μF;0805 ≥ 2.2μF;
1206 ≥ 10μF;1210 ≥ 10μF
16V: 0201 ≥ 0.1μF,0402 ≥ 0.22μF;0603 ≥ 1μF;
0805 ≥ 2.2μF;1206 ≥ 10μF;1210 ≥ 47μF
10V: 0201 ≥ 47nF;0402 ≥ 0.47uF;0603 ≥ 0.47uF
0805 ≥ 2.2uF;1206 ≥ 4.7uF;1210 ≥ 47uF
6.3V
Test temp.: 40 ± 2°C
Humidity: 90 ~ 95%RH
Test time: 500 + 24 / -0 hrs.
To apply voltage:
Rated voltage (MAX. 500V)
Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24 ± 2 hrs at room temp.
Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150°C for 1hr then set for 24 ± 2 hrs at room temp.
ItemRequirementTest Method
High Temperature Load (Endurance)

No remarkable damage.
Cap change:
NP0: ± 3.0% or ± 0.3pF whichever is larger X7R, X5R, X6S, X7S: ≥ 10V**, within ± 12.5%; ≦ 6.3V within ± 25%;
TT series & C ≥ 1uF,within ± 25%
**10V: 0603 ≧ 4.7μF;0402 ≧ 1μF;0201 ≧ 0.1μF, within ± 25%;
Y5V: ≥ 10V, within ± 30%; ≦ 6.3V, within +30 / -40%
Q/D.F. value:
NP0: More than 30pF, Q ≥ 350
10pF ≤ C<30pF, Q ≥ 275+2.5C
Less than 10pF, Q ≥ 200 + 10C
X7R, X5R:

Rated vol.D.F. ≦Exception of D.F. ≦
≧ 100V3%6%1206 ≧ 0.47μF
7.5%0603 ≧ 0.068μF; 0805>0.1μF;1206>1μF; 1210 ≧ 2.2μF
20%0805 > 0.22μF;1210 ≧ 3.3μF
≧ 50V3%6%0201 (50V); 0603 ≧ 0.047μF;0805 ≧ 0.18μF; 1206 ≧ 0.47μF
10%0201 ≧ 0.01uF; 1210 ≧ 4.7μF
20%0402 ≧ 0.1μF;0603>0.1μF;0805 ≧ 1μF;1206 ≧ 2.2μF; 1210 ≧ 10μF
35V5%20%0603 ≧ 1μF;0805 ≥ 2.2μF;1206 ≧ 2.2μF;1210 ≧ 10μF
25V5%10%0201 ≧ 0.01μF; 0805 ≧ 1μF;1210 ≧ 10μF
14%0603 ≧ 0.33μF; 1206 ≧ 4.7μF
15%0201 ≧ 0.1μF;0402 ≧ 0.10μF; 0603 ≧ 0.47μF
0805 ≧ 2.2μF; 1206 ≧ 6.8μF;1210 ≧ 22μF
20%0402 ≥ 0.47μF
16V5%10%0603 ≧ 0.15μF; 0805 ≧ 0.68μF;1206 ≧ 2.2μF;1210 ≧ 4.7μF
15%0201 ≧ 0.01μF (0201 / X7R ≧ 0.022μF);
0402 ≧ 0..33μF; 0603 ≧ 0.68μF;0805 ≧ 2.2μF;
1206 ≧ 4.7μF;1210 ≧ 22μF
10V7.5%15%0201 ≧ 0.012μF;0402 ≧ 0.33μF (0402 / X7R ≧ 0.22μF)
0603 ≧ 0.33μF; 0805 ≧ 2.2μF;1206 ≧ 2.2μF;1210 ≧ 22μF
20%0201 ≧ 0.1μF; 0402 ≧ 1μF
6.3V15%30%0201 ≧ 0.1μF; 0402 ≧ 1μF;0603 ≧ 10μF; 0805 ≧ 4.7μF
1206 ≧ 47μF;1210 ≧ 100μF

Y5V:

Rated vol.D.F. ≦Exception of D.F. ≦
≧ 50V7.5%10%0603 ≧ 0.1μF; 0805 ≧ 0.47μF;1206 ≧ 4.7uF
20%1210 ≧ 6.8μF
35V10%--
25V7.5%10%0402 ≧ 0.047μF; 0603 ≧ 0.1μF;0805 ≧ 0.33μF;
1206 ≧ 1μF;1210 ≧ 4.7μF
15%0402 ≧ 0.068μF; 0603 ≧ 0.47μF;1206 ≧ 4.7μF;
1210 ≧ 22μF
16V (C < 1.0μF)10%12.5%0402 ≧ 0.068μF; 0603 ≧ 0.68μF
20%0402 ≧ 0.22μF
16V (C ≧ 1.0μF)12.5%20%0603 ≧ 2.2μF; 0805 ≧ 3.3μF;1206 ≧ 10μF;
1210 ≧ 22μF;1812 ≧ 47μF
10V20%30%0402 ≧ 0.47μF
6.3V30%--

I.R.: ≥ 10V, 1GΩ or 50 Ω-F whichever is smaller.
Class II (X7R, X5R, Y5V)

Rated VoltageInsulation Resistance
100V: X7R500MΩ or R x C ≧ 5Ω-F Whichever is smaller
50V: 0402>0.01μF;0603 ≥ 1μF;0805 ≥ 1μF;
1206 ≥ 4.7μF;1210 ≥ 4.7μF
35V: 0603 ≥ 1μF;0805 ≥ 2.2μF; 1206 ≧ 2.2μF;1210 ≧ 10μF
25V: 0201 ≧ 0.1uF; 0402 ≥ 0.22μF; 0603 ≥ 2.2μF;0805 ≥ 2.2μF;
1206 ≥ 10μF;1210 ≥ 10μF
16V: 0201 ≥ 0.1μF,0402 ≥ 0.22μF;0603 ≥ 1μF;
0805 ≥ 2.2μF;1206 ≥ 10μF;1210 ≥ 47μF
10V: 0201 ≥ 47nF;0402 ≥ 0.47uF;0603 ≥ 0.47uF
0805 ≥ 2.2uF;1206 ≥ 4.7uF;1210 ≥ 47uF
6.3V

Test temp.:
NP0, X7R: 125 ± 3°C
X5R, Y5V: 85 ± 3°C
Test Time:1000+24/-0hrs
To apply voltage:
(1) ≦ 6.3V or C ≧ 10μF : 150% of rated voltage.
(2) 10V ≦ Ur<500V: 200% of rated voltage.
(3) 500V: 150% of rated voltage.
(4) Ur ≧ 630V: 120% of rated voltage.
(5) 100% of rated voltage for below range.

SizeDielectricRated voltageCapacitance range
0201X5R, X7R≦ 10VC ≧ 0.1uF
≧ 16VC>0.1μF
0402X5R, X7R, Y5V6.3V, 10V, 16V, 25VC ≧ 1.0uF
0603X5R, X7R6.3V, 10VC ≧ 4.7uF
25V, 35VC ≧ 1.0uF
0805X5R, X7R6.3VC ≧ 22uF
10V ~ 50VC ≧ 10uF
1206X5R, X7R6.3VC ≧ 47uF
NPO3000VC ≧ 1.5pF
1210X5R, X7R16VC ≧ 47uF
X7R100VC ≧ 3.3uF

(6) 150% of rated voltage for below range

SizeDielectricRated voltageCapacitance range
0201X5R, X7R16V, 25VC ≧ 0.1uF
X7R16VC>0.022μF
0402X5R, X7R50VC ≧ 1.0uF
10 ~ 25VC ≧ 0.022uF
Y5V16VC ≧ 0.47uF
0603X7R50VC ≧ 0.1uF
X5R, X7R10V, 16V, 50VC ≧ 1.0uF
Y5V16VC ≧ 2.2uF
0805X5R, X7R10V ~ 50VC ≧ 4.7uF
X5R, X7R50VC ≧ 2.2uF
100VC ≧ 0.47uF
Y5V16VC ≧ 4.7uF
1206X5R, X7R100VC ≧ 1.0uF
1210X5R, X7R50V ~ 100VC ≧ 2.2uF

Embalagem

Packaging Quantity (Unit: mm)

TypeThickness / SymbolPackaging (7" Reel)
Paper TapePlastic Tape
02010.30 ± 0.03L15K-
0.30 ± 0.05L15K-
0.30 ± 0.09L15K-
04020.50 ± 0.05N10K-
0.5+0.02/-0.05Q10K-
0.50 ± 0.20E10K-
06030.50 ± 0.10H4K-
0.80 ± 0.10S4K-
0.80 +0.15 / -0.10X4K-
08050.50 ± 0.10H4K-
0.60 ± 0.10A4K-
0.80 ± 0.10B4K-
0.85 ± 0.10T4K-
1.25 ± 0.10D-3K
1.25 ± 0.20I-3K
12060.80 ± 0.10B4K-
0.85 ± 0.10T4K-
0.95 ± 0.10C-3K
1.15 ± 0.15J-3K
1.25 ± 0.10D-3K
1.60 ± 0.20G-2K
1.60 +0.30 / -0.10P-2K
12100.85 ± 0.10T-3K
0.95 ± 0.10C-3K
1.25 ± 0.10D-3K
1.60 ± 0.20G-2K
2.00 ± 0.20K-1K
2.50 ± 0.30M-1K
2.50 ± 0.30M-0.5K
18081.25 ± 0.10D-2K
1.10 ± 0.15F-2K
1.60 ± 0.20G-2K
2.00 ± 0.20K-1K

1812

1.25 ± 0.10D-1K
1.60 ± 0.20G-1K
2.00 ± 0.20K-1K
2.50 ± 0.30M-0.5K
2.80 ± 0.30U-0.5K
06120.80 ± 0.10B4K-

Tape and Reel (Unit: mm)

SMD Capacitor (MC) - Tape and Reel
TypeChip Size
02010402060308051206
0612		121018081812
∅ C13.0 ± 1.013.0 ± 1.013.0 ± 1.013.0 ± 1.013.0 ± 1.013.0 ± 1.013.0 ± 1.013.0 ± 1.0
W9.0 ± 1.09.0 ± 1.09.0 ± 1.09.0 ± 1.09.0 ± 1.09.0 ± 1.013.5 ± 1.013.5 ± 1.0
∅ A178 ± 1.0 (7")178 ± 1.0 (7")178 ± 1.0 (7")178 ± 1.0 (7")178 ± 1.0 (7")178 ± 1.0 (7")178 ± 1.0 (7")178 ± 1.0 (7")
∅ B60.5 ± 1.0 (7")60.5 ± 1.0 (7")60.5 ± 1.0 (7")60.5 ± 1.0 (7")60.5 ± 1.0 (7")60.5 ± 1.0 (7")80.0 ± 1.0 (7")80.0 ± 1.0 (7")

Plastic Tape Size Specification (Unit: mm)

SMD Capacitor (MC) - Plastic Tape Size Specification
Type08051206121018081812
ThicknessDICJDGPTCDGKMDFGKDFGKMU
A0<1.80<200<2.30<3.05<3.05<3.20<2.50<3.90
B0<2.70<3.70<4.00<3.80<3.80<3.95<5.30<5.30
T0.23 ± 0.100.23 ± 0.100.23 ± 0.100.23 ± 0.100.23 ± 0.100.23 ± 0.100.25 ± 0.100.25 ± 0.10
K0<2.50<2.50<2.50<1.50<2.50<3.00<2.50<2.50<3.50
W8.00 ± 0.208.00 ± 0.208.00 ± 0.208.00 ± 0.208.00 ± 0.208.00 ± 0.2012.0 ± 0.2012.0 ± 0.20
P04.00 ± 0.104.00 ± 0.104.00 ± 0.104.00 ± 0.104.00 ± 0.104.00 ± 0.104.00 ± 0.104.00 ± 0.10
P14.00 ± 0.104.00 ± 0.104.00 ± 0.104.00 ± 0.104.00 ± 0.104.00 ± 0.104.00 ± 0.108.00 ± 0.10
P22.00 ± 0.052.00 ± 0.052.00 ± 0.052.00 ± 0.052.00 ± 0.052.00 ± 0.052.00 ± 0.102.00 ± 0.05
D01.50 + 0.1/-01.50 ± 0.051.50 + 0.1/-01.50 + 0.1/-01.50 + 0.1/-01.50 + 0.1/-01.50 + 0.1/-01.50 + 0.1/-0
D11.00 ± 0.101.00 ± 0.101.00 ± 0.101.00 ± 0.101.00 ± 0.101.00 ± 0.101.50 ± 0.101.50 ± 0.10
E1.75 ± 0.101.75 ± 0.101.75 ± 0.101.75 ± 0.101.75 ± 0.101.75 ± 0.101.75 ± 0.101.75 ± 0.10
F3.50 ± 0.053.50 ± 0.053.50 ± 0.053.50 ± 0.053.50 ± 0.053.50 ± 0.055.50 ± 0.105.50 ± 0.10

Paper Tape Size Specification (Unit: mm)

SMD Capacitor (MC) - Paper Tape Size Specification
Type02010402060308051206 / 0612
ThicknessLNESHXAHBTBT
A00.39 ± 0.070.70 ± 0.201.05 ± 0.301.50 ± 0.201.50 ± 0.201.90 ± 0.50
B00.69 ± 0.071.20 ± 0.201.80 ± 0.302.30 ± 0.202.30 ± 0.203.50 ± 0.50
T≦0.50≦0.80≦1.20≦1.15≦1.30≦1.30
W8.00 ± 0.108.00 ± 0.108.00 ± 0.108.00 ± 0.108.00 ± 0.108.00 ± 0.10
P04.00 ± 0.104.00 ± 0.104.00 ± 0.104.00 ± 0.104.00 ± 0.104.00 ± 0.10
P12.00 ± 0.052.00 ± 0.054.00 ± 0.104.00 ± 0.104.00 ± 0.104.00 ± 0.10
P22.00 ± 0.052.00 ± 0.052.00 ± 0.052.00 ± 0.052.00 ± 0.052.00 ± 0.05
D01.55 ± 0.051.55 ± 0.051.55 ± 0.051.55 ± 0.051.55 ± 0.051.50 ± 0.05
E1.75 ± 0.051.75 ± 0.051.75 ± 0.051.75 ± 0.051.75 ± 0.051.75 ± 0.10
F3.50 ± 0.053.50 ± 0.053.50 ± 0.053.50 ± 0.053.50 ± 0.053.50 ± 0.05

Código

  • 682
Download de Arquivos

PROCURAR

Pesquisa de condição:      Pesquisa cruzada

Cardápio

Melhor Venda

Capacitor de Chip Cerâmico Multicamada (Série MC MC12JTB501682)Fabricante - Viking

Com sede em Taiwan, Viking Tech Corporation é um dos principais fabricantes de Capacitor de Chip Cerâmico Multicamada (Série MC MC12JTB501682) desde 1997.E seus produtos são utilizados em aplicações automotivas e de dispositivos eletrônicos, com tolerância de fabricação de até 0,01% e TCR de até 2 ppm em uma ampla variedade de tamanhos de embalagem.

TS16949/ ISO9001/ ISO14001 e atende aos padrões AEC-Q200, Viking tem oferecido resistores de precisão de alta voltagem, alta potência, anti-sulfur, anti-surge, pulso, incluindo resistores de filme fino/ espesso, resistores automotivos, resistores melf, resistores de detecção de corrente, etc. Indutores de baixo ruído, baixo TC, alta potência, como indutores de RF, indutores de chip, indutores de potência, indutores variáveis, indutores de chip de ferrite, indutores blindados, indutores de fio enrolado e indutores de mergulho.

Capacitor de Chip Cerâmico Multicamada (Série MC MC12JTB501682)tem oferecido aos clientes resistores de potência, indutores de potência e capacitores eletrolíticos de alumínio de alta qualidade com sólida reputação. Com tecnologia avançada e 25 anos de experiência, Viking garante atender às demandas de cada cliente.

Capacitor de Chip Cerâmico Multicamada (Série MC MC12JTB501682)tem oferecido aos clientes resistores de potência, indutores de potência e capacitores eletrolíticos de alumínio de alta qualidade com sólida reputação. Com tecnologia avançada e 25 anos de experiência, Viking garante atender às demandas de cada cliente.

Produto Principal

APLICAÇÕES AUTOMOTIVAS

APLICAÇÕES AUTOMOTIVAS

Resistor de precisão de filme fino 0,01%, TC2ppm, wirebondale, Anti-Corrosivo, MELF. Detecção de corrente,...

consulte Mais informação
APLICAÇÕES MÉDICAS

APLICAÇÕES MÉDICAS

Indutores de chip de alta frequência cerâmicos, de tamanho pequeno até 01005. Filme fino, multicamada,...

consulte Mais informação
APLICAÇÕES DE COMUNICAÇÃO

APLICAÇÕES DE COMUNICAÇÃO

O capacitor cerâmico multicamadas oferece alta voltagem, alta frequência, baixo ruído, alto Q, baixo...

consulte Mais informação